1996
DOI: 10.1002/anie.199606861
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Understanding and Manipulating Inorganic Materials with Scanning Probe Microscopes

Abstract: Scanning probe microscopies, such as scanning tunneling microscopy and atomic force microscopy, are uniquely powerful tools for probing the microscopic properties of surfaces. If these microscopies are used to study low‐dimensional materials, from two‐dimensional solids such as graphite to zero‐dimensional nanostructures, it is possible to elucidate atomic‐scale structural and electronic properties characteristic of the bulk of a material and not simply the surface. By combining such measurements with chemical… Show more

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Cited by 35 publications
(19 citation statements)
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“…One factor driving current interest in nanoparticle research is the perceived need for the further miniaturization of both optical and electronic devices. 9,10 There are practical constraints associated with current technologies; lithographic methods cannot at present be used with a resolution much less than ca. 200 nm.…”
Section: Introductionmentioning
confidence: 99%
“…One factor driving current interest in nanoparticle research is the perceived need for the further miniaturization of both optical and electronic devices. 9,10 There are practical constraints associated with current technologies; lithographic methods cannot at present be used with a resolution much less than ca. 200 nm.…”
Section: Introductionmentioning
confidence: 99%
“…One-dimensional semiconductor nanoclusters have some special characteristics due to their large surfaceto-volume ratio, quantum size effect, and dielectric confinement effect [1][2][3][4][5][6]. They are expected to exhibit a variety of new spectroscopic features, including sharper absorption spectra, enhanced exciton and impurity binding energies, and modified electron-phonon coupling.…”
Section: Introductionmentioning
confidence: 99%
“…[259][260][261] Processes such as choosing a single NW or CNT from an ensemble and alignment of it with respect to contacts, usually in an SEM, constitute fundamental tasks for integration. However, its applications in systems development remain confined to pilot fabrication due to the lack of parallel assembly techniques.…”
Section: Integration With Top-down Methods Manipulationmentioning
confidence: 99%