2024 IEEE Radiation Effects Data Workshop (REDW) (In Conjunction With 2024 NSREC) 2024
DOI: 10.1109/redw61286.2024.10759232
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Understanding Commercial Power MOSFET Survivability in a Heavy-Ion Environment Using High Throughput Screening

Dante Castelli,
Omair Ahmad,
Cedric Kong
et al.
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