2015
DOI: 10.1016/j.apsusc.2015.06.086
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Understanding the dispersion of Ag on high surface area TiO2 supports using XPS intensity ratios

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Cited by 17 publications
(5 citation statements)
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“…The intensity ratios I Ni2p /I Zr3d , reported in Table 2, followed the order Ni/YSZ(EDTA) ≈ Ni/YSZ(WI) > Ni/YSZ(EP) ≈ Ni/ YSZ(Mix-n) >> Ni/YSZ(Mix-μ). Being the Ni content similar for all samples, these ratios are proportional to the Ni dispersion [42,43]. In agreement with XRD analysis, clearly Ni was highly dispersed over YSZ surface on samples prepared by wet impregnation with Ni(EDTA) O; ΔH 0 = +38 kJ/mol).…”
Section: Catalystsupporting
confidence: 83%
“…The intensity ratios I Ni2p /I Zr3d , reported in Table 2, followed the order Ni/YSZ(EDTA) ≈ Ni/YSZ(WI) > Ni/YSZ(EP) ≈ Ni/ YSZ(Mix-n) >> Ni/YSZ(Mix-μ). Being the Ni content similar for all samples, these ratios are proportional to the Ni dispersion [42,43]. In agreement with XRD analysis, clearly Ni was highly dispersed over YSZ surface on samples prepared by wet impregnation with Ni(EDTA) O; ΔH 0 = +38 kJ/mol).…”
Section: Catalystsupporting
confidence: 83%
“…Furthermore, the oxidized state of the matrix is also an important parameter to take into account with respect to this process, since it may control the number of point defects (e.g. oxygen vacancies), which mediate the clusters' growth on the surface of TiO 2 . As claimed by Hansen et al , the interaction of Ag clusters with TiO 2 is stronger as the latter is more oxidized.…”
Section: Resultsmentioning
confidence: 99%
“…The obtained XPS spectra were fitted by the GaussianeLorentzian curve-fitting method using a Casa XPS software, and the background was subtracted by Shirley's method prior to curve fitting. Such a XPS data analytic method were established and widely adopted to determine the binding energy of the different element levels accurately [48]. The crystalline structures of the microcapsules were determined by Xeray powder diffraction (XRD) on a Japan Rigaku D/Max 2500 VB2 þ P/C Xeray diffractometer using a Xeray source of CueKa radiation (l ¼ 1.5405 Å), and the scans were performed with a scan rate of 5 /min in the 2q range of 5 e90 , which can cover the full range of diffraction angle for pure silver [49].…”
Section: Characterizationmentioning
confidence: 99%