2023
DOI: 10.3390/surfaces6040031
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Understanding the Effects of Post-Deposition Sequential Annealing on the Physical and Chemical Properties of Cu2ZnSnSe4 Thin Films

Diana-Stefania Catana,
Mohamed Yassine Zaki,
Iosif-Daniel Simandan
et al.

Abstract: Cu2ZnSnSe4 thin films have been synthesized by employing two magnetron-sputtering depositions, interlaced with two sequential post-deposition heat treatments in low vacuum, Sn+Se and Se–rich atmospheres at 550 °C. By employing successive structural analysis methods, namely Grazing Incidence X–Ray Diffraction (GIXRD) and Raman Spectroscopy, secondary phases such as ZnSe coexisting with the main kesterite phase have been identified. SEM peered into the surface morphology of the samples, detecting structural defe… Show more

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Cited by 3 publications
(1 citation statement)
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“…In Figure 8, are presented the diffractograms of annealed CTSe\ZnSe stacks prepared by magnetron sputtering along with the XRD patterns of the most frequent secondary phases in CZTSe films. Catana et al, synthesized in a first step CTSe films from different stacks (Sn\Cu, SnSe 2 \Cu, Sn\Cu 2 S, and SnSe 2 \Cu 2 Se), then a ZnSe layer was added on top of the obtained CTSe films and the combinations were annealed in Se atmosphere at 550 • C [69]. The identification of the ZnSe phase was almost impossible when they compared its XRD patterns to the prepared CZTSe films.…”
Section: Structural Analysis X-ray Diffractionmentioning
confidence: 99%
“…In Figure 8, are presented the diffractograms of annealed CTSe\ZnSe stacks prepared by magnetron sputtering along with the XRD patterns of the most frequent secondary phases in CZTSe films. Catana et al, synthesized in a first step CTSe films from different stacks (Sn\Cu, SnSe 2 \Cu, Sn\Cu 2 S, and SnSe 2 \Cu 2 Se), then a ZnSe layer was added on top of the obtained CTSe films and the combinations were annealed in Se atmosphere at 550 • C [69]. The identification of the ZnSe phase was almost impossible when they compared its XRD patterns to the prepared CZTSe films.…”
Section: Structural Analysis X-ray Diffractionmentioning
confidence: 99%