2022
DOI: 10.1002/adem.202200688
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Understanding the Relation between Pulse Duration and Topography Evolution of Polyether Ether Ketones Textures by Ultrashort Infrared Laser Interference Patterning

Abstract: Since it entered the market in the early 1980s, the deployment of polyaryl ether ketones has gained prominence in a plethora of fields linked to advanced materials design as direct substitutes for metal and ceramic counterparts. [1][2][3][4] For example, in the automotive and aeronautics industries, these materials are being implemented in connectors, seals, and insulators for pumps, which significantly reduces the final weight of the products. [5] Furthermore, in the biomedical field, they have been used in t… Show more

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Cited by 2 publications
(4 citation statements)
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“…The process of microstructuring in DLIP can engage either photothermal, photochemical, or a combination of these mechanisms, depending on the interaction between laser light and the utilized materials [125]. In [126], the DLIP process scheme was presented (Figure 9). The influence of pulse duration and pulse-to-pulse overlap was investigated.…”
Section: Laser Surface Modification By Direct Laser Interference Patt...mentioning
confidence: 99%
See 1 more Smart Citation
“…The process of microstructuring in DLIP can engage either photothermal, photochemical, or a combination of these mechanisms, depending on the interaction between laser light and the utilized materials [125]. In [126], the DLIP process scheme was presented (Figure 9). The influence of pulse duration and pulse-to-pulse overlap was investigated.…”
Section: Laser Surface Modification By Direct Laser Interference Patt...mentioning
confidence: 99%
“…Λ indicates the period of the interference structure formed on the processed material's surface, aligning with the structure's period. The variables h, dx, and dy denote the height of the structure and the dimensions of the elliptically shaped focal spot of the laser beam, respectively, while α represents the angle between the laser beams[126].…”
mentioning
confidence: 99%
“…For fluence above 0.32 J cm −2 , the percentage of nanoarrangements with disruptions exceeds 10% and the quantification of the average width becomes inaccurate. 34 Last but not least, to analyze the electroactivity of the films, two conductivity-related measurements were carried out. On one hand, at the macroscopic level, the resistance of the films was measured by a four-point probe system, using an electrometer (Sourcemeter 2450, Keithley, USA).…”
mentioning
confidence: 99%
“…This trend is expected, since the energy per pulse increases dramatically with the applied fluence. For fluence above 0.32 J cm –2 , the percentage of nanoarrangements with disruptions exceeds 10% and the quantification of the average width becomes inaccurate …”
mentioning
confidence: 99%