IEEE Symposium Conference Record Nuclear Science 2004.
DOI: 10.1109/nssmic.2004.1462360
|View full text |Cite
|
Sign up to set email alerts
|

Undoped InSb schottky detector for gamma ray measurements

Abstract: For measuring X-rays and gamma-rays with better energy resolution and higher efficiency than conventional semiconductor detectors such as Si and Ge detectors, we are studying InSb radiation detectors. Previously, we fabricated p-InSb Schottky type, pn-junction type detectors, and undoped InSb Schottky type detectors with an electrode of 3 mm in diameter, and measured alpha particles of 241 Am. For measuring gamma-rays, we fabricated undoped InSb Schottky type detectors with smaller electrode areas. Gamma-ray s… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(2 citation statements)
references
References 6 publications
0
2
0
Order By: Relevance
“…In case of the energy of gamma rays being converted into electrons by photoelectric effect, the energy of photoelectrons is almost the same as that of primary gamma rays, i.e., 59 keV. The range of electrons with 59 keV in InSb substrate is estimated as nearly 20 m. 7 On the other hand, the depletion layer thickness of the undoped InSb detector without applying bias voltage was 9 m. 6 Most of the photoelectrons escaped from the depletion layer with depositing their energy partly. For the measurement of a photopeak, the thickness of the depletion layer should be increased.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…In case of the energy of gamma rays being converted into electrons by photoelectric effect, the energy of photoelectrons is almost the same as that of primary gamma rays, i.e., 59 keV. The range of electrons with 59 keV in InSb substrate is estimated as nearly 20 m. 7 On the other hand, the depletion layer thickness of the undoped InSb detector without applying bias voltage was 9 m. 6 Most of the photoelectrons escaped from the depletion layer with depositing their energy partly. For the measurement of a photopeak, the thickness of the depletion layer should be increased.…”
Section: Discussionmentioning
confidence: 99%
“…This undoped wafer was n-type by the polarity of preamplifier output pulses in the alpha particle measurements. 6 The wafer was cut to the dimensions of nearly 5 mmϫ 7 mm. Both sides of the InSb substrate were etched using a mixture of nitric and lactic acids (1:10) for 5 min.…”
Section: A Device Fabrication and Current-voltage Curvesmentioning
confidence: 99%