2015
DOI: 10.1063/1.4914916
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Uniaxial and tensile strained germanium nanomembranes in rolled-up geometry by polarized Raman scattering spectroscopy

Abstract: We present a rolled-up approach to form Ge microtubes and their array by rolling-up hybrid Ge/Cr nanomembranes, which is driven by the built-in stress in the deposited Cr layer. The study of Raman intensity as a function of the angle between the crystal-axis and the polarization-direction of the scattered light, i.e., polarized Raman measurement reveals that the strain state in Ge tube is uniaxial and tensile, and can reach a maximal value 1.0%. Both experimental observations and theoretical calculations sugge… Show more

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Cited by 15 publications
(17 citation statements)
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“…The resonance peak position (PP) at 641.0 nm (mode #196 marked by the dark triangle in Figure b) has almost no shift (see details in Section 5 of the Supporting Information). It is known that the tube presents a poor thermal conductivity because of its hollow structure . However, our NC‐diamond microtubes are stable even under the maximal excitation power (25 mW) of our PL setup since diamond has the high thermal conductivity (2000 W m −1 K −1 ) and low thermo‐optic coefficient of (d n /d T ) = 10 × 10 −6 K −1 …”
mentioning
confidence: 94%
“…The resonance peak position (PP) at 641.0 nm (mode #196 marked by the dark triangle in Figure b) has almost no shift (see details in Section 5 of the Supporting Information). It is known that the tube presents a poor thermal conductivity because of its hollow structure . However, our NC‐diamond microtubes are stable even under the maximal excitation power (25 mW) of our PL setup since diamond has the high thermal conductivity (2000 W m −1 K −1 ) and low thermo‐optic coefficient of (d n /d T ) = 10 × 10 −6 K −1 …”
mentioning
confidence: 94%
“…Micro-Raman scattering is an effective tool to estimate the strain distributions in semiconductor nanostructures [16,47]. Figure 3(a) shows a typical Raman spectrum of GeSn NMs excited by the 514 nm laser.…”
Section: Resultsmentioning
confidence: 99%
“…18,23 In our experiment, based on the basic polarization Raman setup (see the schematic setup in Fig. 2), the polarization Raman measurements are performed to determine the strain state of the top Si layer, and the polarized Raman scattering intensity is a function of the polarized angle (denoted as θ) between the [110] axis and the polarization vector of the excitation laser (e i ) (marked in the dashed box in Fig.…”
Section: Resultsmentioning
confidence: 99%