The evolution of
lattice strain on crystallographic domain structures
and magnetic properties of epitaxial low-bandwidth manganite Gd
0.6
Ca
0.4
MnO
3
(GCMO) films have been studied
with films on different substrates: SrTiO
3
, (LaAlO
3
)
0.3
(Sr
2
AlTaO
6
)
0.7
, SrLaAlO
3
, and MgO. The X-ray diffraction data reveals
that all of the films, except the films on MgO, are epitaxial and
have an orthorhombic structure. Cross-sectional transmission electron
microscopy (TEM) shows lattice mismatch-dependent microstructural
defects. Large-enough tensile strain can increase oxygen vacancies
concentration near the interface and can induce vacancies in the substrate.
In addition, a second phase was observed in the films with tensile
strain. However, compressive strain causes dislocations in the interface
and a mosaic domain structure. On the other hand, the magnetic properties
of the films, including saturation magnetization, coercive field,
and transport property depend systematically on the substrate-induced
strain. Based on these results, the choice of appropriate substrate
is an important key to obtaining high-quality GCMO film, which can
affect the functionality of potential device applications.