The texture development of PEN films with different semicrystalline morphologies have been studied by X-ray diffraction. These different structures have been obtained by uniaxially stretching PEN amorphous films at 100 and 1608C (below and above T g ) at different drawing ratios. Samples have also been characterized by DSC to determine the crystallinity ratios, the crystallization, and melting temperatures. To define the orientation of crystallites in the oriented samples, pole figures have been constructed, as a function of temperature and drawing ratio (DR) in the range 1.5-4. In the range from DR ¼ 2 to 4 the orientation is clearly uniplanar-axial. At T draw ¼ 1008C the crystallinity shown by DSC analysis is higher than the sample stretched at 1608C. The orientation is also higher when samples are stretched at 1008C. The naphthalene rings mainly stay in the plane of the film with a lower fraction perpendicular to the plane of the film.