2018 Ural Symposium on Biomedical Engineering, Radioelectronics and Information Technology (USBEREIT) 2018
DOI: 10.1109/usbereit.2018.8384620
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Unidirectional synapse-like behavior of Zr/ZrO<inf>2</inf>-NT/Au layered structure

Abstract: Zirconia nanotubular layer with an outer tube diameter  25 nm was synthesized by potentiostatic anodization. The Zr/ZrO2-NT/Au memristive structure is fabricated using stencil mask and magnetron sputtering techniques. Currentvoltage characteristics are measured in full cycles of resistive switching with varying parameters of the applied harmonic voltage. An equivalent circuit with unidirectional electrical conductivity for the studied structure is proposed. Estimates of the electrical resistance of memristors… Show more

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Cited by 2 publications
(4 citation statements)
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“…In the process, lower values of r are recorded. It should be noted that Schottky barriers are possible to emerge in the region of interfaces in ZrO 2 -based MDM structures [34,39]. In the process, the values of the indicated potential barriers, as well as the features of the Schottky emission in highly resistive states are governed by the materials of the contacts and the defectiveness of the active layer of memristors [17,23,25].…”
Section: Analysis Of I-v Curvesmentioning
confidence: 98%
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“…In the process, lower values of r are recorded. It should be noted that Schottky barriers are possible to emerge in the region of interfaces in ZrO 2 -based MDM structures [34,39]. In the process, the values of the indicated potential barriers, as well as the features of the Schottky emission in highly resistive states are governed by the materials of the contacts and the defectiveness of the active layer of memristors [17,23,25].…”
Section: Analysis Of I-v Curvesmentioning
confidence: 98%
“…It is known that the resistive switching in the oxide layer of MDM structures underlying the memory device operation is usually provided by the mobility of anionic (V O ) vacancies [21,25,27,[29][30][31][33][34][35], ions of impurity metals [19-21, 25, 26, 28, 35-37] or Zr + [17,30,38] in the active layer under an external electric field. The electrical resistance of the memristor in low-resistance (LRS), high-resistance (HRS) and intermediate states are governed by the thickness and imperfection of the dioxide layer [24,26,30,33,34,39]. In this case, one of the most probable mechanisms of resistive switching in as-grown ZrO 2 -based structures is the chainordering of V O vacancies followed by the formation of conductive channels or filaments between metal contacts.…”
Section: Introductionmentioning
confidence: 99%
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“…Нанопористрые и нанотубулярные массивы диоксида циркония (ZrO 2 -nt) используются в различных отраслях науки и техники благодаря высокой химической, механической, температурной стабильности и площади поверхности [1][2][3]. На их основе производятся батареи, конденсаторы, топливные элементы, твердые электролиты, катализаторы, дозиметры и мемристоры [4][5][6][7].…”
Section: Introductionunclassified