Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)
DOI: 10.1109/iccdcs.2002.1004027
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Unified extraction method for amorphous and polycrystalline TFT above threshold model parameters

M. Estrada
1
,
A. Cerdeira
2
,
A. Ortíz‐Conde3
et al.
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