2017
DOI: 10.1111/jere.12170
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Unit Root Tests for Dependent Micropanels

Abstract: This paper proposes a new test for the null hypothesis of panel unit roots for micropanels with short time dimensions (T) and large cross‐sections (N). There are several distinctive features of this test. First, the test is based on a panel AR(1) model allowing for cross‐sectional dependency, which is introduced by a factor structure of the initial condition. Second, the test employs the panel AR(1) model with AR(1) coefficients that are heterogeneous for finite N. Third, the test can be used both for the alte… Show more

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Cited by 6 publications
(2 citation statements)
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“…Cross-sectional dependency in panel data analysis might lead to incorrect estimation results ( 65 ). The Pesaran CD test, which is valid for either a constant T or a constant N, will be used in this investigation.…”
Section: Methods and Data Sourcesmentioning
confidence: 99%
“…Cross-sectional dependency in panel data analysis might lead to incorrect estimation results ( 65 ). The Pesaran CD test, which is valid for either a constant T or a constant N, will be used in this investigation.…”
Section: Methods and Data Sourcesmentioning
confidence: 99%
“…Most of the existing literature dealing with the properties of panel unit root tests focuses on the comparison of a few most commonly used panel unit root tests, mainly the Im, Pesaran and Shin test and Levin, Lin and Chu test [9,13,15,26]. In addition, asymptotical power and size are studied in most cases, especially in the papers introducing individual unit root tests, and the discussion of finite sample properties tends to focus on datasets with larger cross-sectional (N ) and time (T ) dimensions [20,6]. In practice, however, many investigated data sets involve smaller N or T dimensions.…”
Section: Introductionmentioning
confidence: 99%