Jpn. J. Appl. Phys.
 2011
DOI: 10.7567/jjap.50.04dc12
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Universal Relationship between Substrate Current and History Effect in Silicon-on-Insulator Metal–Oxide–Semiconductor Field-Effect Transistors

Shuhei Amakawa
1
,
Asato Toda
2
,
Kazumi Ohyama
3
et al.
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