Topological insulators (TIs) with unique band structures have wide application prospects in the fields of ultra-fast optical and spintronic devices. The dynamics of hot carriers plays a key role in these TI based devices. In this work, using time and angle resolved photoemission spectroscopy (TR-ARPES) technique, the relaxation process of the hot carriers in Cr doped Bi2Se3 has been systematically studied, where the ferromagnetic TI is one of the key building blocks for the next generation spintronics.It is found that the electronic temperature (Te) and chemical potential (μ) decrease faster with the increase of the Cr doping concentration. Similarly, the lifetime (τ) of the excited electrons also decreases with more Cr doped into TIs. The results suggest a new mechanism of the impurity bands assisted carrier relaxation, where the impurity bands within the bulk band gap introduced by Cr doping provide significant recombination channels for the excited electrons. This work directly illustrates the dynamic process of the carriers in Cr doped Bi2Se3, which is expected to promote the applications of (Bi1-xCrx)2Se3 in ultrafast optical and spintronic devices.