2023
DOI: 10.1016/j.mtphys.2023.101064
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Unraveling the ferroelectric switching mechanisms in ferroelectric pure and La doped HfO2 epitaxial thin films

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Cited by 13 publications
(2 citation statements)
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“…The energy barrier for ferroelectric direction switching is calculated to be 0.98 eV/ Ta atom. The switching barrier is comparable to barriers reported in other ferroelectric systems, including HfO 2 -based ferroelectric systems, 28 indicating that 2D Ta 3 I 8 is completely applicable in experiments for ferroelectric switching. The polarization value of 7.6 × 10 −10 C/m obtained using the Berry phase method, 29,30 is comparable to recent reports for 2D SnSe, 31 phosphorene, 32 and bulk BaTiO 3 .…”
supporting
confidence: 79%
“…The energy barrier for ferroelectric direction switching is calculated to be 0.98 eV/ Ta atom. The switching barrier is comparable to barriers reported in other ferroelectric systems, including HfO 2 -based ferroelectric systems, 28 indicating that 2D Ta 3 I 8 is completely applicable in experiments for ferroelectric switching. The polarization value of 7.6 × 10 −10 C/m obtained using the Berry phase method, 29,30 is comparable to recent reports for 2D SnSe, 31 phosphorene, 32 and bulk BaTiO 3 .…”
supporting
confidence: 79%
“…Moreover, the recently developed variable cell solid state NEB method fixed the deficiency of NEB in the solid state transition. 68 Recently, Silva et al 67 reported a epitaxial orthorhombic phase in La doped HfO 2 films with a constantly decreasing coercive field for 2–5 at% La-doping and suggested that the reason is the defects of doping lower the energy barrier in different pathways of polarization switching in the domain wall as shown in Fig. 5c and d, and could lead to a large polarization value (∼70 μC cm −2 ).…”
Section: Ferroelectric Origin In Hfo2mentioning
confidence: 95%