1997
DOI: 10.1103/physrevlett.79.4413
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Unusual Strain Relaxation in Cu Thin Films on Ni(001)

Abstract: Surface x-ray diffraction has been used to study the growth of thin Cu films on Ni(001). We give direct evidence for the formation of embedded wedges with internal ͕111͖ facets in the film, as recently suggested by Müller et al. [Phys. Rev. Lett. 76, 2358]. The unusual strain distribution within the wedges is determined and provides an explanation to the observed sudden change in growth and film morphology around 20 monolayers. [S0031-9007(97)

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Cited by 20 publications
(8 citation statements)
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“…10,11 By increasing the number of Cu overlayers, this protrusive stripe grew in width forming ͕111͖ internal facets in the Cu film, in agreement with Auger-electron diffraction ͑AED͒, 12 x-ray photoelectron diffraction ͑XPD͒, [13][14][15] and surface x-ray diffraction. 16 For these studies, there was no indication of intermixing or roughening at the interface between the Ni substrate and Cu overlayers, therefore, the Ni͑001͒ substrate was assumed to be intact even after Ni overlayer formation. For the Cu/Ni͑111͒ surface, the perturbed ␥␥ angular correlation ͑PAC͒ of 111 In ͑Ref.…”
Section: Introductionmentioning
confidence: 99%
“…10,11 By increasing the number of Cu overlayers, this protrusive stripe grew in width forming ͕111͖ internal facets in the Cu film, in agreement with Auger-electron diffraction ͑AED͒, 12 x-ray photoelectron diffraction ͑XPD͒, [13][14][15] and surface x-ray diffraction. 16 For these studies, there was no indication of intermixing or roughening at the interface between the Ni substrate and Cu overlayers, therefore, the Ni͑001͒ substrate was assumed to be intact even after Ni overlayer formation. For the Cu/Ni͑111͒ surface, the perturbed ␥␥ angular correlation ͑PAC͒ of 111 In ͑Ref.…”
Section: Introductionmentioning
confidence: 99%
“…These studies confirm the internal faceting model for copper on Ni(100) and give a detailed insight into the relaxation behavior of the copper film. Rasmussen et al [117][118][119] have proved not only the occurrence of internal {111} facets but also the shift of the stripe atoms by half a nearest neighbor distance. Their measurement of the constant stripe height (0.05 nm) agrees well with the STM and spot profile analysis of low energy electron diffraction 116 as well as with the hard sphere model.…”
Section: Concurring Model For Misfit Accommodation: Inclined Stackingmentioning
confidence: 99%
“…Their measurement of the constant stripe height (0.05 nm) agrees well with the STM and spot profile analysis of low energy electron diffraction 116 as well as with the hard sphere model. 114 Since synchrotron Xray diffraction also yields information about deeper film layers, Rasmussen et al 118,119 were able to detect the suggested lateral relaxation of the copper atoms within the stripe as well as the formation of pseudomorphic copper in between. Furthermore, the vertical lattice spacing of copper in the wedges as well as between them can be extracted using an appropriate model.…”
Section: Concurring Model For Misfit Accommodation: Inclined Stackingmentioning
confidence: 99%
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“…Following the development of Ge hut clusters on Si(100) (Mo et al, 1990), several types of islands have been observed in different systems (Legoues et al, 1994;Leonard et al, 1993 andRasmussen et al, 1997). For better device performance of quantum-dot structures, the objective now is to obtain islands of the same size, shape and strain-state, and to find a mechanism for self-organized ordering (Tersoff et al, 1996).…”
Section: Introductionmentioning
confidence: 99%