Unveiling localized electronic properties of ReS2 thin layers at nanoscale using Kelvin force probe microscopy combined with tip-enhanced Raman spectroscopy
Abstract:The electronic properties of two-dimensional (2D) material is strongly modulated by localized strain. The typical spatial resolution of conventional Kelvin probe force microscopy(KPFM) is usually limited in few hundreds nanometers, which is hard to characterize the localized electronic properties of 2D materials at the nanoscale. Herein, tip-enhanced Raman spectroscopy(TERS) was proposed to combine with KPFM to break this restriction. TERS scan was conducted on ReS2 bubbles deposited on rough Au thin film to o… Show more
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