Abstract:A better understanding of structural properties and growth kinetics of Stranski-Krastanov (SK) quantum dots is necessary for applying dot potential in optical and electronic applications. In fact, We have recently demonstrated theoretically and experimentally, the ability of reflection high energy electron diffraction (RHEED) tool in quantitative analysis such as extracting average dot size, facet orientation and average dot density and real time monitoring of dot size during growth .As an extended study, in t… Show more
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