2021
DOI: 10.1002/pssa.202000621
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Unveiling the Role of Al2O3 Interlayer in Indium–Gallium–Zinc–Oxide Transistors

Abstract: Although insertion of a thin insulating layer between metal electrodes and a semiconducting channel is an effective way to improve device performance, the exact reason for improvement in performance is not elucidated. Herein, the role of an Al2O3 interlayer sandwiched between Al metal electrodes and an amorphous indium–gallium–zinc–oxide semiconducting channel is systematically investigated. The Al2O3 interlayer results in not only a good transistor performance with increased on current but also improved gate … Show more

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Cited by 5 publications
(1 citation statement)
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“…To address these issues, extensive research efforts have been dedicated for passivation of devices containing IGZO TFTs, thermal annealing, insertion of a metal or insulator capping layer on the channel layers, and utilizing a bilayer channel structure to enhance the drive current and reliability of the devices. 9–14 Furthermore, the device geometry should be carefully designed and the channel material must be optimized, as device performance can differ even between transistor devices with the same constituting elements. Currently, a protruded local back gate structure is predominantly used in IGZO TFTs.…”
Section: Introductionmentioning
confidence: 99%
“…To address these issues, extensive research efforts have been dedicated for passivation of devices containing IGZO TFTs, thermal annealing, insertion of a metal or insulator capping layer on the channel layers, and utilizing a bilayer channel structure to enhance the drive current and reliability of the devices. 9–14 Furthermore, the device geometry should be carefully designed and the channel material must be optimized, as device performance can differ even between transistor devices with the same constituting elements. Currently, a protruded local back gate structure is predominantly used in IGZO TFTs.…”
Section: Introductionmentioning
confidence: 99%