This article presents the first spectral responsivity calibration system in the EUV region in Taiwan. This system enables local foundries to adjust the exposure parameters of an EUV exposure machine with more certain knowledge, and thus could simplify the dose calibration processes and save energy consumption. This system utilizes the EUV radiation generated from synchrotron radiation light source, covering a wavelength range from 10 nm (123.98 eV) to 15 nm (82.66 eV), including the commonly used 13.5 nm (91.84 eV). This article mainly focuses on the performance evaluation of the current calibration system. Several measurement uncertainty sources will be determined and compared to identify the dominant measurement uncertainty sources for future improvement. The relative expanded uncertainty of the spectral responsivity calibration at 13.5 nm is 4.6 % (k = 2), which meets the industrial tolerance for exposure dose determination.