2019
DOI: 10.1109/ted.2019.2937159
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Upgrade of Drain Current Compact Model for Nanoscale Triple-Gate Junctionless Transistors to Continuous and Symmetric

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Cited by 5 publications
(33 citation statements)
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“…where W eff = N fin (2H fin + W fin ) is the effective width, N fin is the number of fins, H fin and W fin are the fin height and fin width respectively, L is the channel length, C ox is the gate oxide capacitance per unit area and V th is the thermal voltage. The normalized charge at Chapter 4: Continuous and symmetric compact modeling 74 coordinate y along the channel, q y , is given by (4.13) in terms of the threshold voltage V t and the ideality factor ε defined in [154] for TG JLTs:…”
Section: Trans-capacitance Compact Modelmentioning
confidence: 99%
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“…where W eff = N fin (2H fin + W fin ) is the effective width, N fin is the number of fins, H fin and W fin are the fin height and fin width respectively, L is the channel length, C ox is the gate oxide capacitance per unit area and V th is the thermal voltage. The normalized charge at Chapter 4: Continuous and symmetric compact modeling 74 coordinate y along the channel, q y , is given by (4.13) in terms of the threshold voltage V t and the ideality factor ε defined in [154] for TG JLTs:…”
Section: Trans-capacitance Compact Modelmentioning
confidence: 99%
“…where F = W eff C ox  eff V d R sd /L, R sd is the series resistance, L eff = L -L and L is the channel length shortening due to short-cannel effects. Both  eff and L are expressed in terms of the normalized charges q s and q d [154]. In JL transistors, the channel is buried in the center of the nanowire and the association of the gate oxide capacitance per unit area C ox with the depletion capacitance C dep due to the depletion formed between the gate oxide and the mobile charges, reduces the total capacitance that drives the drain current.…”
Section: Trans-capacitance Compact Modelmentioning
confidence: 99%
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