Upgrade of the ion beam analysis end-station with the wavelength dispersive X-ray spectrometer for use with the focused MeV ion beams

Božičević Mihalić, Iva; Mioković, Anja; Rodriguez Ramos, Mauricio; Cosic, Donny; Mudronja, Domagoj; Tkalčević, Marija; Fazinić, Stjepko

doi:10.1016/j.measurement.2024.115325

Measurement

2024

DOI: 10.1016/j.measurement.2024.115325

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Upgrade of the ion beam analysis end-station with the wavelength dispersive X-ray spectrometer for use with the focused MeV ion beams

Iva Božičević Mihalić,

Anja Mioković,

Mauricio Rodriguez Ramos

et al.

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Analysis of Cd and Ag clusters by concurrent standard and high-resolution micro-PIXE spectroscopy

Mihalić,

Mioković,

Masekane

et al. 2025

Radiation Physics and Chemistry

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Analysis of Cd and Ag clusters by concurrent standard and high-resolution micro-PIXE spectroscopy

Mihalić,

Mioković,

Masekane

et al. 2025

Radiation Physics and Chemistry

View full text Add to dashboard Cite

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Upgrade of the ion beam analysis end-station with the wavelength dispersive X-ray spectrometer for use with the focused MeV ion beams

Cited by 1 publication

References 62 publications

Analysis of Cd and Ag clusters by concurrent standard and high-resolution micro-PIXE spectroscopy

Analysis of Cd and Ag clusters by concurrent standard and high-resolution micro-PIXE spectroscopy

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