2016
DOI: 10.5478/msl.2016.7.2.41
|View full text |Cite
|
Sign up to set email alerts
|

Uranium Particle Identification with SEM-EDX for Isotopic Analysis by Secondary Ion Mass Spectrometry

Abstract: : Secondary ion mass spectrometry (SIMS) is a promising tool to measure isotope ratios of individual uranium particles in environmental samples for nuclear safeguards. However, the analysis requires prior identification of a small number of uranium particles that coexist with a large number of other particles without uranium. In the present study, this identification was performed by scanning electron microscopy -energy dispersive X-ray analysis with automated particle search mode. The analytical results for a… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2

Citation Types

0
4
0

Year Published

2018
2018
2024
2024

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(4 citation statements)
references
References 11 publications
0
4
0
Order By: Relevance
“…Detection and analysis of U-containing particles by SEM–EDX was performed, as described in our previous study 19 . The automatic particle finder 42 used in SEM–EDX identified U-containing particles larger than 1.0 µm in diameter from the same sample used for the alpha track analysis. The field of view was fixed by observing the BSE image of a part of the sample at a magnification of 1500×.…”
Section: Methodsmentioning
confidence: 99%
“…Detection and analysis of U-containing particles by SEM–EDX was performed, as described in our previous study 19 . The automatic particle finder 42 used in SEM–EDX identified U-containing particles larger than 1.0 µm in diameter from the same sample used for the alpha track analysis. The field of view was fixed by observing the BSE image of a part of the sample at a magnification of 1500×.…”
Section: Methodsmentioning
confidence: 99%
“…The same sample that had been used to complete alpha track analysis was used for U-containing particles larger than 0.5 µm in diameter using the automatic particle finder 17 of the SEM-EDX. First, the field of view was fixed by observing the back-scattered electron image of part of the sample for observation at a magnification of ×1500.…”
Section: Methodsmentioning
confidence: 99%
“…However, while these methods are effective for CsMPs with high radioactivity, it is difficult to selectively detect α-emitters that are present in small amounts and with low specific radioactivity. Therefore, we decided to use a combination of an automated particle measurement method using SEM-EDX 17 and a method for detecting particles containing α-emitters using solid-state track detectors 18 24 .…”
Section: Introductionmentioning
confidence: 99%
“…An important preliminary step before conducting isotopic analysis of individual particles is to determine their location and identification in a sample covered with a large quantity of nonspecific environmental dust. While particle screening can be performed using scanning electron microscopy combined with energy-dispersive X-ray spectroscopy (SEM-EDX), 6 SIMS is the only method that both localizes the particles and provides their isotopic composition. 7 There are several factors limiting the performance of those two particle-screening methods.…”
Section: Introductionmentioning
confidence: 99%