2019
DOI: 10.1007/978-3-030-21722-8_9
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Usage of Silicon for Label-Free Super-Resolved Imaging

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“…Further development of our approach while using timetunable pulses for the pump and the probe allowed us to play with the position of the focus of the probe beam and control its focusing and defocusing processes in deeper layers of the silicon chip [521][522][523][524][525][526] and not only on the wafer's surface. We used probe near IR (at 𝜆 = 1.55 ÎŒm) beam and a pump beam at 𝜆 = 775nm with 30 ps pulse width, with a donut shape (generated via beam shaping vortex phase plate).…”
Section: The Conceptmentioning
confidence: 99%
“…Further development of our approach while using timetunable pulses for the pump and the probe allowed us to play with the position of the focus of the probe beam and control its focusing and defocusing processes in deeper layers of the silicon chip [521][522][523][524][525][526] and not only on the wafer's surface. We used probe near IR (at 𝜆 = 1.55 ÎŒm) beam and a pump beam at 𝜆 = 775nm with 30 ps pulse width, with a donut shape (generated via beam shaping vortex phase plate).…”
Section: The Conceptmentioning
confidence: 99%