Usage of the contactless vector network analysis with varying transmission line geometries

Abstract

Abstract. The scattering parameters of embedded devices can be measured by means of contactless vector network analysis. To achieve accurate measurement results, the contactless measurement setup has to be calibrated. However, if the substrate material or the planar transmission lines on the substrate changes, a new calibration is necessary. In this paper a method will be examined, which reduces the number of calibration cycles by using a database. Analytical results show that by using this database method, errors occur which depend on the coupling coefficients and on the load impedances of the contactless probes. However, the measurement results show deviations smaller than 7% in comparison to the conventional vector network analysis, which is sufficient for the most pratical applications.

Widefield microwave imaging in alkali vapor cells with sub-100μm resolution

“…This field serves as the quantization axis, and the resulting ∼MHz Zeeman splitting of the 87 Rb hyperfine ground state transitions allows each transition to be individually addressed by tuning the microwave frequency. significant calibration problem in other microwave sensors [40], relating the field to a measured oscillation frequency and well-known fundamental physical constants. Data taking is fast, due to the parallel nature of the measurement (imaging as opposed to scanning).…”

“…Imaging with the static field pointing in the X, Y , and Z directions allows us to image each polarisation component in turn. Using atoms as sensors, our technique avoids the significant calibration problem in other microwave sensors [39], relating the field to a measured oscillation frequency and well-known fundamental physical constants. Data taking is fast, due to the parallel nature of the measurement (imaging as opposed to scanning).…”