Use of an Electron Flood Gun to Reduce Surface Charging in X-Ray Photoelectron Spectroscopy

Huchital, D. A.; McKeon, R. T.

doi:10.1063/1.1654090

Cited by 73 publications

(17 citation statements)

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“…For the photoelectron spectroscopy analyses on bulk insulator specimens, one has to explore another way. Whereas the neutralization of the photoholes by using an electron flood gun has been a widely adopted tactic for inorganic insulator materials, 107,108 it is hardly applicable to the organic semiconductor samples because the electrons tend to bring about the chemical degradation in these materials as mentioned above. Zimmermann et al attempted the ARUPS measurements on the single crystal perylene with a compensation of the photoholes by thermionic electrons from a LaB 6 filament equipped nearby the crystal, which was not succeeded in obtaining reasonable ARUPS spectra.…”

Section: Methods Of Overcoming Sample Charging Of An Electrical Insulamentioning

confidence: 99%

Photoelectron spectroscopy on single crystals of organic semiconductors: experimental electronic band structure for optoelectronic properties

2020

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Section: Methods Of Overcoming Sample Charging Of An Electrical Insulamentioning

confidence: 99%

Photoelectron spectroscopy on single crystals of organic semiconductors: experimental electronic band structure for optoelectronic properties

2020

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“…This had the effect of reducing the A1 2p binding energy to values closer to the reference binding energy though there was some sample charging still present (-1 eV) in some of the samples. Using low-energy electrons from an electron flood gun does not only allow correction of the peak positions for charging but gives the additional advantage of decreasing the peak broadening (18). It was found that in the case of the blank alumina the Al 2p peak was present at 74.6 e V after the charge neutralizer was turned on.…”

Section: (C) X-ray Photoelectron Spectroscopy (Xps)mentioning

confidence: 99%

A chemisorption and XPS study of bimetallic Pt-Sn/Al2O3 catalysts

Balakrishnan

Schwank

1991

Journal of Catalysis

153

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Bimetallic Pt-Sn/AlzO3 catalysts with nominally 1 wt% Pt and varying tin contents (0-3.25 wt%) prepared by coimpregnation of nonporous Degussa alumina were characterized by chemisorption of H2, 02, and CO at room temperature. The surface compositions and oxidation states of the reduced catalysts were tracked by XPS. Addition of tin to Pt resulted in significant differences in the gas uptake characteristics of the three adsorbates. Both H2 and CO showed an initial increase in gas uptake with addition of small amounts of tin, and then the chemisorbed amount tended to drop off with further addition of tin. In the case of 02 adsorption, there was a steady increase in gas uptake with increasing tin content. XPS of the reduced catalysts showed that in aluminasupported samples most of the tin was in a valence state of either Sn(II) or Sn(IV). On the other hand, large amounts of zero-valent tin were found in a SiO2-supported Pt-Sn catalyst which had been prepared from the same precursors and reduced under identical conditions. This supports the notion that interactions between the alumina support and tin prevent the complete reduction of tin.

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“…This problem however can be easily remedied using an electron flood gun mounted in the HIM chamber. Electron flood guns have been used to reduce surface charging in X‐ray photoelectron spectroscopy (Huchital and McKeon, ), focused ion beam (Utlaut, ), and secondary ion mass spectrometry (Gilmore and Seah, ) techniques for many years. In HIM, an integrated electron flood gun can be used to deliver a diffuse beam of low‐energy electrons to the area being imaged between successive scans (or lines of a scan).…”

Section: Introductionmentioning

confidence: 99%

Helium ion microscopy of Lepidoptera scales

Boden¹,

Asadollahbaik²,

Rutt³

et al. 2011

Scanning

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In this report, helium ion microscopy (HIM) is used to study the micro and nano-structures responsible for structural color in the wings of two species of Lepidotera from the Papilionidae family: Papilio ulysses (Blue Mountain Butterfly) and Parides sesostris (Emerald-patched Cattleheart). Electronic charging under the beam of uncoated scales from the wings of these butterflies is successfully neutralized, leading to images displaying a large depth-offield and a high level of surface detail, which would normally be obscured by traditional coating methods used for scanning electron microscopy (SEM). The images are compared to those from variable pressure SEM, demonstrating the superiority of HIM at high magnifications. In addition, the large depth-of-field capabilities of HIM are exploited through the creation of stereo pairs which allows the exploration of the third dimension. Furthermore, the extraction of quantitative height information which matches well with cross-sectional transmission electron microscopy (TEM) measurements from the literature is demonstrated.

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Use of an Electron Flood Gun to Reduce Surface Charging in X-Ray Photoelectron Spectroscopy

Cited by 73 publications

References 1 publication

Photoelectron spectroscopy on single crystals of organic semiconductors: experimental electronic band structure for optoelectronic properties

Photoelectron spectroscopy on single crystals of organic semiconductors: experimental electronic band structure for optoelectronic properties

A chemisorption and XPS study of bimetallic Pt-Sn/Al2O3 catalysts

Helium ion microscopy of Lepidoptera scales

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