2023
DOI: 10.1016/j.solener.2023.02.002
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Use of non-contact voltmeter to quantify potential induced degradation in CdTe modules

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Cited by 4 publications
(1 citation statement)
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“…12 In the field, several reliability issues can damage the module, leading to lower power output or complete failure. [13][14][15] Potential induced degradation (PID) is a reliability issue reported in 2005 by Swanson et al 16 that can develop when PV strings operate at high absolute voltages (1000-1500 V) under high temperature and humidity conditions. 17,18 The PID mechanisms can reduce module output by as high as 30%.…”
Section: Introductionmentioning
confidence: 99%
“…12 In the field, several reliability issues can damage the module, leading to lower power output or complete failure. [13][14][15] Potential induced degradation (PID) is a reliability issue reported in 2005 by Swanson et al 16 that can develop when PV strings operate at high absolute voltages (1000-1500 V) under high temperature and humidity conditions. 17,18 The PID mechanisms can reduce module output by as high as 30%.…”
Section: Introductionmentioning
confidence: 99%