Use of Primary Beam Filtration in Estimating Mass Attenuation Coefficients by Compton Scattering

O’Connor, B. H.; Chang, W.J.

doi:10.1007/978-1-4613-2471-3_4

Advances in X-Ray Analysis 1985

DOI: 10.1007/978-1-4613-2471-3_4

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Use of Primary Beam Filtration in Estimating Mass Attenuation Coefficients by Compton Scattering

B. H. O’Connor¹,

W.J. Chang²

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2006

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Measurement of background components in wavelength dispersive X‐ray fluorescence spectrometry

Verkhovodov¹

2006

X-Ray Spectrometry

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Three components of the background have been investigated: first, characteristic radiation of the lamellas of the collimator excited by secondary x-ray beam; second, secondary x-ray beam scattered by the lamellas of the collimator; third, diffusive and incoherent scattering of the secondary x-ray beam by the focusing crystal. The relationships between chemical content of the specimen and the intensity of the first and the second components were determined by a wavelength-dispersive x-ray spectrometer that has an energydispersive x-ray detector. The intensity of the third component was very low. It was not found in this experiment. 304 P. O. Verkhovodov allows absorption correction to be done in the determination of elements in the medium of heavy elements. A procedure for noble metal testing in powder samples was created.

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Measurement of background components in wavelength dispersive X‐ray fluorescence spectrometry

Verkhovodov¹

2006

X-Ray Spectrometry

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show abstract

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Use of Primary Beam Filtration in Estimating Mass Attenuation Coefficients by Compton Scattering

Cited by 1 publication

References 2 publications

Measurement of background components in wavelength dispersive X‐ray fluorescence spectrometry

Measurement of background components in wavelength dispersive X‐ray fluorescence spectrometry

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