Microsc Microanal
 2006
DOI: 10.1017/s1431927606068152
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Using a Focused Ion Beam to Characterize the Microstructure of Porous Lanthanum Strontium Manganite (LSM) Electrodes

A Chen
1
,
J. R. Smith
2
,
R. T. DeHoff
3
et al.

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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