2012
DOI: 10.1016/j.microrel.2012.08.022
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Using a new bathtub curve to correlate quality and reliability

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Cited by 27 publications
(14 citation statements)
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“…Jiang and Murthy (2009) put forward a statistical method to model the effect of quality variations in manufacturing on product reliability based on Weibull distribution. Roesch (2012) proposed a new bathtub curve to reveal quality and reliability correlations, and he emphasized that the relationship can predict future experiences in reliability based on manufacturing quality data. Kim (2013) investigated the effect of manufacturing defects on the infant failure rate and observed that for any product, the failure rate decreases if the device-to-device variability of the number of defects is large enough.…”
Section: State Of the Artmentioning
confidence: 99%
See 1 more Smart Citation
“…Jiang and Murthy (2009) put forward a statistical method to model the effect of quality variations in manufacturing on product reliability based on Weibull distribution. Roesch (2012) proposed a new bathtub curve to reveal quality and reliability correlations, and he emphasized that the relationship can predict future experiences in reliability based on manufacturing quality data. Kim (2013) investigated the effect of manufacturing defects on the infant failure rate and observed that for any product, the failure rate decreases if the device-to-device variability of the number of defects is large enough.…”
Section: State Of the Artmentioning
confidence: 99%
“…Infant failures have often been referred to the quality problems occurred in the "infant" region of leftmost of bathtub curve of product life (Roesch, 2012), and infant failures are assumed to be caused mainly by design vulnerabilities and manufacturing defects (Jiang and Murthy, 2009). Because of the high occurrence possibility of early failures in infant life, the infant failure rate always keeps unexpectedly high and received extensive attention.…”
Section: Introductionmentioning
confidence: 99%
“…However, these studies ignore the interference of harmful factors in the manufacturing process and cannot fundamentally guide the reliability improvement program of a product. From another perspective, due to defects in the manufacturing process, hidden defects in the product only explode with time and stress in the initial stage of use [ 31 ]. He et al believed that the high failure rate of a product in the early stages of use could be considered a manifestation of low production reliability [ 32 , 33 ].…”
Section: Introductionmentioning
confidence: 99%
“…Jin et al 11 applied the Six Sigma methodology and presented a closed-loop control framework for estimating infant failures of products. In the field of semiconductor manufacturing, Roesch 12 discussed the connotations of yield, quality, and reliability and then proposed a new bathtub curve that measures fallout to predict batch reliability. Kim 13 focused on the effect of manufacturing defect accumulation on the product infant failure and presented a defect-based reliability model.…”
Section: Introductionmentioning
confidence: 99%