2017
DOI: 10.1109/tsm.2017.2750719
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Using an Optical Motion Sensor for Visualization and Analysis of Maintenance Work on Semiconductor Manufacturing Equipment

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Cited by 6 publications
(1 citation statement)
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“…The conventional optical arc detection method is distorted by strong sunlight or other environmental lights, and it is hard to distinguish the light of pantograph–catenary arc from interference. 12,13 It can be seen that the arc detection using the characteristics of current and light has some disadvantages, especially in the pantograph–catenary system. Due to the complex environment of the pantograph–catenary system, the arc detection would be affected easily by external factors.…”
Section: Introductionmentioning
confidence: 99%
“…The conventional optical arc detection method is distorted by strong sunlight or other environmental lights, and it is hard to distinguish the light of pantograph–catenary arc from interference. 12,13 It can be seen that the arc detection using the characteristics of current and light has some disadvantages, especially in the pantograph–catenary system. Due to the complex environment of the pantograph–catenary system, the arc detection would be affected easily by external factors.…”
Section: Introductionmentioning
confidence: 99%