2013
DOI: 10.1134/s1061934813130066
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Using high resolution and dynamic reaction cell for the improvement of the sensitivity of direct silicon determination in uranium materials by inductively coupled plasma mass spectrometry

Abstract: Abstract-The paper describes solving the problem of direct silicon determination at low levels in uranium materials, caused by the spectral interferences of polyatomic ions and the high value of blank levels, using inductively coupled plasma mass spectrometry (ICP MS). To overcome the interference problem, two pri mary techniques have been applied: double focusing high resolution ICP MS and dynamic reaction cell (DRC) filled with highly reactive ammonia gas. All measurements were performed at high resolution (… Show more

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Cited by 3 publications
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“…at low levels in uranium materials. [324][325][326] Special systems for gaseous impurity concentration built-in-to the EI mass spectrometer inlet system has been developed at this Plant in order to increase the performance of mass spectrometry methods for inorganic impurity analysis. 327 An absolute method for the determination of isotopic composition of substances in multiple collector mass spectrometers has been proposed and demonstrated on the samples of uranium hexafluoride having 235 U within a wide range of concentrations.…”
Section: Inorganic Chemistry and Elemental Analysismentioning
confidence: 99%
“…at low levels in uranium materials. [324][325][326] Special systems for gaseous impurity concentration built-in-to the EI mass spectrometer inlet system has been developed at this Plant in order to increase the performance of mass spectrometry methods for inorganic impurity analysis. 327 An absolute method for the determination of isotopic composition of substances in multiple collector mass spectrometers has been proposed and demonstrated on the samples of uranium hexafluoride having 235 U within a wide range of concentrations.…”
Section: Inorganic Chemistry and Elemental Analysismentioning
confidence: 99%