“…Therefore, other methods are needed to obtain more accurate lattice positions of the atomic images by atomistic simulation. [47] Although the molecular dynamics (MD) method [54][55][56][57][58][59][60] can display lattice defect structures at the atomic level, its characteristic time scale [54,61] of the order of picoseconds is too short to describe accurately the motion of grain boundary(GB) and dislocations in the microsecond order of diffusion time scale. [54,62] PFC method, [62,63] newly proposed, has the advantages of spatial atomic resolution scale and diffusion time scale and can well simulate the lattice defect structure [64][65][66][67][68] of crystal materials and can also well describe the movement of atomic-level defects [69][70][71][72][73] under external stress or external strain, for example, the slip and climb of dislocation, [71] the migration and premelting [74,75] of grain boundaries, the diffusion of vacancies, [76,77] solidification of metal, [78] the growth and closure of voids, [79][80][81] growth and rotation of grain, [70,71] the nucleation and extension of cracks, [82][83][84][85][86] and so on.…”