2015
DOI: 10.1007/s00396-015-3541-8
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Using neutral impact collision ion scattering spectroscopy and angular resolved X-ray photoelectron spectroscopy to analyze surface structure of surfactant solutions

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Cited by 2 publications
(3 citation statements)
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“…For example, at 2 nm from the interface, the potential predicted by the BW model is −86 mV, while the KR model gives −59 mV, which is significantly lower than −115 mV, as predicted by our model. Consequently, the concentration of the surfactant ion outside of the adsorption layer predicted by those two traditional models is much lower than the bulk concentration at 2 nm from the air–water interface, which contradicts experimental and simulation results. ,,, Our model has the slowest surface potential decrease from the air–water interface. Also, only our model gives a continuous change in surfactant concentration.…”
Section: Resultscontrasting
confidence: 65%
See 1 more Smart Citation
“…For example, at 2 nm from the interface, the potential predicted by the BW model is −86 mV, while the KR model gives −59 mV, which is significantly lower than −115 mV, as predicted by our model. Consequently, the concentration of the surfactant ion outside of the adsorption layer predicted by those two traditional models is much lower than the bulk concentration at 2 nm from the air–water interface, which contradicts experimental and simulation results. ,,, Our model has the slowest surface potential decrease from the air–water interface. Also, only our model gives a continuous change in surfactant concentration.…”
Section: Resultscontrasting
confidence: 65%
“…Consequently, the concentration of the surfactant ion outside of the adsorption layer predicted by those two traditional models is much lower than the bulk concentration at 2 nm from the air−water interface, which contradicts experimental and simulation results. 1,3,60,61 Our model has the slowest surface potential decrease from the air− water interface. Also, only our model gives a continuous change in surfactant concentration.…”
Section: Model Of Ion Distribution At the Air−water Interfacementioning
confidence: 87%
“…The first type of loss process is elastic energy loss, which enables the determination of the mass of the elements. The other type of loss process is inelastic energy loss, whereby the projectiles lose energy on their trajectory through the bulk by low angle scattering and electronic excitations (stopping power) [ 60 ]. This type of loss can be used to determine the concentration depth profiles of the elements in the sample because it governs the depth travelled by the projectiles, provided the target atom is heavier than the projectile.…”
Section: Experimental Procedure: Materials and Device Fabricationmentioning
confidence: 99%