2001
DOI: 10.1109/16.915729
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Using porous silicon as semi-insulating substrate for β-SiC high temperature optical-sensing devices

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Cited by 23 publications
(10 citation statements)
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“…In this work, C 3 H 8 was used as the carbon source, and obtained the alloy composition as Si 0.48 C 0.15 N 0.37 in base of the Auger Electron Spectroscopy measurements. On the other hand, owing to the PS layer's sponge-like structure to relieve strain and the development of cracks after the post cooling [13][14][15][16][17][18], and thus favors the nucleation. As a result, the SiCN film grown on a PS layer has a better single crystalline property as can be found from the low angle X-ray diffraction (XRD) spectra shown in Fig.…”
Section: Resultsmentioning
confidence: 97%
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“…In this work, C 3 H 8 was used as the carbon source, and obtained the alloy composition as Si 0.48 C 0.15 N 0.37 in base of the Auger Electron Spectroscopy measurements. On the other hand, owing to the PS layer's sponge-like structure to relieve strain and the development of cracks after the post cooling [13][14][15][16][17][18], and thus favors the nucleation. As a result, the SiCN film grown on a PS layer has a better single crystalline property as can be found from the low angle X-ray diffraction (XRD) spectra shown in Fig.…”
Section: Resultsmentioning
confidence: 97%
“…Hence, we think, it should be more attributed to the PS layer's flexible feature. A flexible PS severs as the buffer layer to relax the stress caused by the different thermal expansion coefficient between the n-SiCN and the p-Si substrate, and thus suppresses the generation of defects in the interface [17,18]. As illustrated in Fig.…”
Section: Resultsmentioning
confidence: 99%
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“…[5][6][7][8][9] Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), and transmission electron microscopy (TEM) are employed to evaluate the chemical and physical characteristics of these films and are compared to each other. The method has been applied successfully in preparing highquality ␤-SiC film on a Si substrate.…”
Section: Introductionmentioning
confidence: 99%
“…Conventionally, a porous film is implemented by the electrochemical etching method [6]; however, it is very difficult to get a porous DLC film with etching method for its extreme chemical stability. In this work, for the first time, we successfully get the porous DLC film on the porous Si substrate to develop a high UV sensitivity metal-semiconductor-metal (MSM) photodiode.…”
mentioning
confidence: 99%