2006
DOI: 10.1016/j.compchemeng.2006.05.004
|View full text |Cite
|
Sign up to set email alerts
|

Using process topology in plant-wide control loop performance assessment

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
28
0

Year Published

2009
2009
2024
2024

Publication Types

Select...
5
3
1

Relationship

0
9

Authors

Journals

citations
Cited by 56 publications
(28 citation statements)
references
References 32 publications
0
28
0
Order By: Relevance
“…The methods with greatest impact are data-driven [7][8] and are mainly supported by dimensionality reduction techniques like Principal Component Analysis [9] and Independent Component Analysis [10]. Recent work [11][12] has successfully integrated data-driven analysis with process knowledge without quantitative models of the process, by using an electronic process schematic to extract the causal information in an automated way. The use of quantitative model-based methods has, in fact, had little impact in process industries [5,7] due, in part, to the inherent nonlinear nature of chemical processes and the uncertainties of thermodynamic data [7][8].…”
Section: A Fault Detection and Diagnosis In The Context Of Process Imentioning
confidence: 99%
“…The methods with greatest impact are data-driven [7][8] and are mainly supported by dimensionality reduction techniques like Principal Component Analysis [9] and Independent Component Analysis [10]. Recent work [11][12] has successfully integrated data-driven analysis with process knowledge without quantitative models of the process, by using an electronic process schematic to extract the causal information in an automated way. The use of quantitative model-based methods has, in fact, had little impact in process industries [5,7] due, in part, to the inherent nonlinear nature of chemical processes and the uncertainties of thermodynamic data [7][8].…”
Section: A Fault Detection and Diagnosis In The Context Of Process Imentioning
confidence: 99%
“…The paper builds on the work of Yim et al, (2006). In that work, a list of elements in the process schematic and the connections between them were parsed from its CAEX description.…”
Section: Contribution Of the Papermentioning
confidence: 99%
“…This technique was comprehensively reviewed by Maurya et al (2003), who also showed how to derive systematically these qualitative models from model equations. Recently, some authors have extracted this knowledge from process schematics; Yim et al (2006) used schematics represented electronically under the CAEX standard, and Jiang et al (2009) converted the process schematic to a digraph based on the information of the controllers.…”
Section: Sources Of Information In Process Performance Analysismentioning
confidence: 99%
“…Recently, some progress has been done with the integration of different sources of information, with Cecilio et al (2011) demonstrating the value of integrating data from the mechanical, electrical and utility systems with process data, and Yim et al (2006) and Maurya et al (2003) who combined the connectivity information from process schematics with data-driven analysis methods. However, most contributions for process performance analysis are still based on process measurements alone.…”
Section: Introductionmentioning
confidence: 99%