Using Scanning Probe Microscopy to Characterize Nanoparticles and Nanocrystals

Serem, Wilson K.; Lusker, Kathie L.; Garno, Jayne C.

doi:10.1002/9780470027318.a9155

Cited by 6 publications

(6 citation statements)

References 189 publications

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“…This is mainly because piezoelectric actuators can perform movements with atomic precision or better when controlled electronically. This method family is referred to as piezoelectric techniques [80]. The second common denominator is that the data is usually acquired in the form of a two-dimensional grid of data points, which is then displayed in false color as a computer picture.…”

Section: Scanning Probe Microscopy (Spm)mentioning

confidence: 99%

“…Furthermore, AFM may be used to produce excellent views of samples in both air and liquid media without the need for a vacuum chamber, which is another benefit. While the contact mode and tapping mode are the most often used imaging modes for AFM, there are a variety of additional modes that need particular changes to the instrument setup [80].…”

Section: Scanning Probe Microscopy (Spm)mentioning

confidence: 99%

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New Analytical Approaches for Effective Quantification and Identification of Nanoplastics in Environmental Samples

et al. 2021

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Nanoplastics (NPs) are a rapidly developing subject that is relevant in environmental and food research, as well as in human toxicity, among other fields. NPs have recently been recognized as one of the least studied types of marine litter, but potentially one of the most hazardous. Several studies are now being reported on NPs in the environment including surface water and coast, snow, soil and in personal care products. However, the extent of contamination remains largely unknown due to fundamental challenges associated with isolation and analysis, and therefore, a methodological gap exists. This article summarizes the progress in environmental NPs analysis and makes a critical assessment of whether methods from nanoparticles analysis could be adopted to bridge the methodological gap. This review discussed the sample preparation and preconcentration protocol for NPs analysis and also examines the most appropriate approaches available at the moment, ranging from physical to chemical. This study also discusses the difficulties associated with improving existing methods and developing new ones. Although microscopical techniques are one of the most often used ways for imaging and thus quantification, they have the drawback of producing partial findings as they can be easily mixed up as biomolecules. At the moment, the combination of chemical analysis (i.e., spectroscopy) and newly developed alternative methods overcomes this limitation. In general, multiple analytical methods used in combination are likely to be needed to correctly detect and fully quantify NPs in environmental samples.

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Section: Scanning Probe Microscopy (Spm)mentioning

confidence: 99%

Section: Scanning Probe Microscopy (Spm)mentioning

confidence: 99%

New Analytical Approaches for Effective Quantification and Identification of Nanoplastics in Environmental Samples

et al. 2021

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“…The first scan of MFM measurements provides a topographic image displaying a convolution of the tip and the nanoparticle [24]. The topographic cross section is simulated by using a Gaussian profile at the position of the nanoparticle (black line in Fig.…”

Section: Theorymentioning

confidence: 99%

Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

Krivcov¹,

Ehrler²,

Fuhrmann³

et al. 2019

Beilstein J. Nanotechnol.

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Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects between tip and substrate is discussed in relation to the thickness of a dielectric layer introduced in the system. Single superparamagnetic iron oxide nanoparticles (SPIONs) are used as a model system, because their magnetic signal is contrariwise to the signal due to capacitive coupling so that it is possible to distinguish between magnetic and electric force contributions. Introducing a dielectric layer between substrate and nanoparticle the capacitive coupling can be tuned and minimized for thick layers. Using the theory of capacitive coupling and the magnetic point dipole–dipole model we could theoretically explain and experimentally prove the phase signal for single superparamagnetic nanoparticles as a function of the layer thickness of the dielectric layer. Tuning the capacitive coupling by variation of the dielectric layer thickness between nanoparticle and substrate allows the distinction between the electric and the magnetic contributions to the MFM signal. The theory also predicts decreasing topographic effects in MFM signals due to surface roughness of dielectric films with increasing film thickness.

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“…From the defl ection of the cantilever we can measure the forces generated between the sample and probe tip [57]. This defl ection moves a laser spot, which refl ects into an arrangement of photodiodes that offers a 3D visualization of the nanoparticle [58]. Liquid dispersions can be imaged using AFM.…”

Section: Atomic Force Microscopy (Afm)mentioning

confidence: 99%