2011
DOI: 10.1016/j.mineng.2011.01.004
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Using SPH one-way coupled to DEM to model wet industrial banana screens

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Cited by 112 publications
(43 citation statements)
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“…Banana screens can be installed in double or triple deck configurations with dimensions up to 10 Â 24 ft. Polyurethane panels are a common deck material, given superior wear characteristics; however, traditional punch plates remain common [13]. Several recent studies have used Discrete Element Modeling (DEM) to analyze the particle-level interactions occurring on banana screens [14,15].…”
Section: Screeningmentioning
confidence: 99%
“…Banana screens can be installed in double or triple deck configurations with dimensions up to 10 Â 24 ft. Polyurethane panels are a common deck material, given superior wear characteristics; however, traditional punch plates remain common [13]. Several recent studies have used Discrete Element Modeling (DEM) to analyze the particle-level interactions occurring on banana screens [14,15].…”
Section: Screeningmentioning
confidence: 99%
“…In our previous modelling of multiphase flow in mills and screens we have used a 1-way coupling based on the assumption that the coarse solids dominate the flows and that the fluid flows predominantly through the pore space of fairly densely packed larger particles Morrison, 2011, 2012;Sinnott et al, 2011;and Fernandez et al, 2011).…”
Section: Coupling Of Phasesmentioning
confidence: 99%
“…The question of the required resolution is also similar to the question of how much resolution is required to adequately resolve flow through the regular array of openings in a screen or the grate in a mill. Fernandez et al (2011) examined this using SPH and found that ideally ten particles across an opening is required but sometimes as few as 3-4 particles could be adequate. For lower resolution, there is significant unphysical numerical resistance to fluid particles entering and passing through small openings.…”
Section: Coupling Of Phasesmentioning
confidence: 99%
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“…In wet granular slurries, the fluid-particle interaction is significant and has been modeled through one-way coupled DEM-CFD models (e.g. [2,3,6] and references therein) or two-way coupled models (e.g. [10]).…”
mentioning
confidence: 99%