UTBB FD-SOI Variability Characterization Using Programmable Transistor Arrays

Mahmoud, M. Mounir; Prinzie, J.; Belie, A. Adebabay; De Raedemaeker, S.; Leroux, P.

doi:10.1109/ipfa58228.2023.10249085

2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2023

DOI: 10.1109/ipfa58228.2023.10249085

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UTBB FD-SOI Variability Characterization Using Programmable Transistor Arrays

M. Mounir Mahmoud,

J. Prinzie,

A. Adebabay Belie

et al.

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UTBB FD-SOI Variability Characterization Using Programmable Transistor Arrays

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References 18 publications

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