2019
DOI: 10.3390/diagnostics10010001
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Utility of Scanning Electron Microscopy Elemental Analysis Using the ‘NanoSuit’ Correlative Light and Electron Microscopy Method in the Diagnosis of Lanthanum Phosphate Deposition in the Esophagogastroduodenal Mucosa

Abstract: Background: We have recently developed the correlative light and electron microscopy of hematoxylin and eosin (H&E)-stained glass slides using the ‘NanoSuit’ method. The aim of this study is to explore the utility of the new NanoSuit-correlative light and electron microscopy method combined with scanning electron microscopy-energy dispersive X-ray spectroscopy elemental analysis for the diagnosis of lanthanum phosphate deposition in the H&E-stained glass slides. Methods: Nine H&E-stained glass slid… Show more

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Cited by 11 publications
(14 citation statements)
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“…The benefits of the NanoSuit method include a charge-reducing effect without using heavy metals, and it is easy and quick to perform without requiring specialized equipment such as a draft chamber or sputtering equipment. The use of the NanoSuit method in medical applications has gradually increased [ 13 , 20 , 21 , 22 ]. The NanoSuit membrane is very thin and does not interfere with the analysis of each element.…”
Section: Discussionmentioning
confidence: 99%
See 3 more Smart Citations
“…The benefits of the NanoSuit method include a charge-reducing effect without using heavy metals, and it is easy and quick to perform without requiring specialized equipment such as a draft chamber or sputtering equipment. The use of the NanoSuit method in medical applications has gradually increased [ 13 , 20 , 21 , 22 ]. The NanoSuit membrane is very thin and does not interfere with the analysis of each element.…”
Section: Discussionmentioning
confidence: 99%
“…The NanoSuit membrane is very thin and does not interfere with the analysis of each element. NanoSuit has been shown to protect entire H&E-stained paraffin sections against drying, preserve elements and small molecules for EDS analysis, and enable re-staining with H&E [ 11 , 13 ]. However, the localized electrical beam marks remained after the EDS analysis in the present study because of the use of an electric beam at the maximum level ( Supplemental Figure S3 ).…”
Section: Discussionmentioning
confidence: 99%
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“…FE-SEM images were captured using the secondary electron (SE) detector with 520 K Shinmura et al reference to the backscattered electron (BSE) detector image. Sections used for ARL13B immunohistochemistry were also used for SEM observation using the NanoSuit-correlative light and electron microscopy (CLEM) method [31,32] and the SEM images were captured using the SE detector.…”
Section: Scanning Electron Microscopy (Sem) Analysis Using the Nanosuit Methodsmentioning
confidence: 99%