2023
DOI: 10.1109/tr.2023.3294795
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Utilizing Parity Checking to Optimize Soft Error Detection Through Low-Level Reexecution

Brent De Blaere,
Jens Vankeirsbilck,
Jeroen Boydens

Abstract: Higher component density, lower voltage levels and higher transistor counts increase programmable systems' susceptibility to transient faults. At the same time, the adoption of embedded systems in many safety-critical and mission-critical systems makes their reliability of utmost importance. Softwareimplemented error detection techniques can be utilized to protect these systems as an alternative to less flexible and costlier hardware solutions like redundant hardware or fully duplicated systems. One of these t… Show more

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Cited by 2 publications
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