2009
DOI: 10.1080/08927020802395427
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Vacancy clustering and diffusion in germanium using kinetic lattice Monte Carlo simulations

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Cited by 3 publications
(3 citation statements)
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“…In the case of Ge implantation with high energy of 180 keV, the tail is observed even below 1 lm deep region without additional annealing process. In addition, V Ge and Ge i are uniformly distributed from surface to bulk regions after the long time annealing process due to the high diffusivity values of Ge i (1 Â 10 À5 cm 2 /s at 600 C) and V Ge (4.8 Â 10 À8 cm 2 /s at 600 C), 18 consequently making the Frenkel pairs recombination to occur at both surface and bulk regions. Very high p-type concentration was observed in the as-implanted sample due to V Ge with acceptor level at 0.20 eV above the top of the Ge valence band.…”
Section: Resultsmentioning
confidence: 99%
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“…In the case of Ge implantation with high energy of 180 keV, the tail is observed even below 1 lm deep region without additional annealing process. In addition, V Ge and Ge i are uniformly distributed from surface to bulk regions after the long time annealing process due to the high diffusivity values of Ge i (1 Â 10 À5 cm 2 /s at 600 C) and V Ge (4.8 Â 10 À8 cm 2 /s at 600 C), 18 consequently making the Frenkel pairs recombination to occur at both surface and bulk regions. Very high p-type concentration was observed in the as-implanted sample due to V Ge with acceptor level at 0.20 eV above the top of the Ge valence band.…”
Section: Resultsmentioning
confidence: 99%
“…4(a)), the diffusivity of P atoms was estimated to be 7.09 Â 10 À16 cm 2 /s at 550 C, which was much slower than that of V Ge (4.12 Â 10 À8 cm 2 /s). 18 A number of V Ge left near surface region due to preferential momentum transfer 22 are also expected to be distributed uniformly from surface to bulk region by its high diffusivity at each annealing temperatures. Since the V Ge which is not healed after annealing at 550 C acts as a recombination trap center in Ge n þ /p junction interface, a high generation current (I G ) was observed in the junction sample annealed at 550 C. Above 600 C, because the number of V Ge was significantly decreased, the annealed junction sample showed dramatic decrease of off-current density while maintaining on-current density, which subsequently provided a higher on/off-current ratio of 5 Â 10 3 .…”
Section: Resultsmentioning
confidence: 99%
“…The migration and formation energies of point defects in germanium crystals have been studied by Śpiewak et al [ 3 ] and Kang et al [ 5 ] based on atomic simulations. Śpiewak et al calculated the vacancy and self-interstitial migration and formation energies using MD simulations based on several empirical potentials and compared their results to DFT and experimental values.…”
Section: Introductionmentioning
confidence: 99%