2019
DOI: 10.1111/ffe.12976
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Vacuum effects on fatigue crack growth in submicrometre‐thick freestanding copper films

Abstract: To clarify vacuum effects on fatigue crack growth in freestanding metallic thin films, experiments were conducted on approximately 500‐nm‐thick copper films inside a field emission scanning electron microscope. Fatigue crack growth accompanied by intrusion/extrusion formation occurred in vacuum, and da/dN was smaller than in air in the middle‐ΔK region (ΔK ≈ 1.7‐3.1 MPam1/2). Conversely, in the low‐ΔK region (ΔK ≲ 1.7 MPam1/2), da/dN was larger in vacuum than in air. Further, fatigue crack growth in vacuum occ… Show more

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Cited by 3 publications
(2 citation statements)
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“…化試験片 (Kondo et al, 2013(Kondo et al, , 2019bにおいても観察された. nm と 20 nm の薄膜の da/dN は等しく,また,toxide ≈ 0, 2 nm の薄膜に比べて da/dN が低下し,K ≈ 1.3 ~ 1.4 MPam 1/2 において下限界に至った.すなわち,酸化層が薄い場合(toxide ≈ 0, 2 nm)と厚い場合(toxide ≈ 6, 20 nm)に分ける と,Kth (toxide ≈ 0, 2 nm) < Kth (toxide ≈ 6, 20 nm)であった.…”
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“…化試験片 (Kondo et al, 2013(Kondo et al, , 2019bにおいても観察された. nm と 20 nm の薄膜の da/dN は等しく,また,toxide ≈ 0, 2 nm の薄膜に比べて da/dN が低下し,K ≈ 1.3 ~ 1.4 MPam 1/2 において下限界に至った.すなわち,酸化層が薄い場合(toxide ≈ 0, 2 nm)と厚い場合(toxide ≈ 6, 20 nm)に分ける と,Kth (toxide ≈ 0, 2 nm) < Kth (toxide ≈ 6, 20 nm)であった.…”
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“…Fig.7Effect of surface oxide layer thickness t oxide on fatigue crack propagation properties. Fatigue crack propagation properties oft oxide ≈ 2nm are taken from the previous research(Kondo et al, 2019b).…”
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confidence: 99%