Vacuum Microelectronics

Brodie, I.; Spindt, C.A.

doi:10.1016/s0065-2539(08)60006-2

Cited by 322 publications

(122 citation statements)

References 81 publications

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“…In addition to the atom probe discussed below, a number of other related technologies also evolved from the field emission and field ion microscopes, for example, the field emission sources commonly used in electron microscopes, field emitter arrays, 11,12 and field ion sources for ion beams and propulsion sources. 13 In addition, the topographiner developed by Young et al 14 and later developments of the scanning tunneling microscope and the atomic force microscope 15 are directly related to the field ion microscope.…”

Section: The Field Ion Microscopementioning

confidence: 99%

Atom probe tomography

Kelly¹,

Miller

2007

Review of Scientific Instruments

758

345

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The technique of atom probe tomography ͑APT͒ is reviewed with an emphasis on illustrating what is possible with the technique both now and in the future. APT delivers the highest spatial resolution ͑sub-0.3-nm͒ three-dimensional compositional information of any microscopy technique. Recently, APT has changed dramatically with new hardware configurations that greatly simplify the technique and improve the rate of data acquisition. In addition, new methods have been developed to fabricate suitable specimens from new classes of materials. Applications of APT have expanded from structural metals and alloys to thin multilayer films on planar substrates, dielectric films, semiconducting structures and devices, and ceramic materials. This trend toward a broader range of materials and applications is likely to continue.

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Section: The Field Ion Microscopementioning

confidence: 99%

Atom probe tomography

Kelly¹,

Miller

2007

Review of Scientific Instruments

758

345

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“…This atom optical experiment would benefit from developing an ''atom camera'' that would measure the entire speckle pattern in one exposure. Field emission and ionization tip arrays have been developed and used in various sensor and display applications [26,27], and integrating these with the necessary ion optics and area detector would provide a sound approach for such a development. If such an atom camera were FIG.…”

Section: Prl 97 013202 (2006) P H Y S I C a L R E V I E W L E T T E R Smentioning

confidence: 99%

Speckle Patterns with Atomic and Molecular de Broglie Waves

et al. 2006

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“…The basic physics of field emission is summarized by the Fowler-Nordheim equation, which states that the emission current increases exponentially with increasing electrical field. 53 For a metal with a flat surface, the threshold field is typically around 10 4 V/µm, which is impractically high. All the field emission materials reply on field enhancement at the sharp tips/protrusions.…”

Section: Electron Field Emission Propertiesmentioning

confidence: 99%

Materials Science of Carbon Nanotubes: Fabrication, Integration, and Properties of Macroscopic Structures of Carbon Nanotubes

et al. 2002

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In this Account, we summarize some of our recent studies on the materials properties of the carbon nanotubes (CNTs). The focus is on single-wall carbon nanotubes (SWNTs). We describe experiments on synthesis of SWNTs with controlled molecular structures and assembly of functional macroscopic structures. In addition, we present results on the electron field emission properties of macroscopic CNT cathodes.

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Vacuum Microelectronics

Cited by 322 publications

References 81 publications

Atom probe tomography

Atom probe tomography

Speckle Patterns with Atomic and Molecular de Broglie Waves

Materials Science of Carbon Nanotubes: Fabrication, Integration, and Properties of Macroscopic Structures of Carbon Nanotubes

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