Abstract:The conversion to lead free Ball Grid Array (BGA) packages has raised several new assembly and reliability issues. Lead-free solder joints are generally stiffer than tin-lead solder joints, and mechanically induced failures have become more prevalent in lead-free solder assemblies. Traditionally, assembly bend and shock testing is performed to evaluate mechanical assembly reliability. However, bend and shock tests are expensive, cumbersome and not feasible for evaluating lot-to-lot variations in mechanical str… Show more
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