2017 First International Conference on Latest Trends in Electrical Engineering and Computing Technologies (INTELLECT) 2017
DOI: 10.1109/intellect.2017.8277633
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Validation of selecting SP-values for fault models under proposed RASP-FIT tool

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Cited by 3 publications
(3 citation statements)
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“…1) Gate-level Designs: At gate abstraction level, the basic cell of the design is a logic gate. A logic circuit which contains a few hundreds of logic gates are typically designed at this level [4]. xor, bufif0, etc.…”
Section: A Code Parsing Technique In Rasp-fitmentioning
confidence: 99%
See 1 more Smart Citation
“…1) Gate-level Designs: At gate abstraction level, the basic cell of the design is a logic gate. A logic circuit which contains a few hundreds of logic gates are typically designed at this level [4]. xor, bufif0, etc.…”
Section: A Code Parsing Technique In Rasp-fitmentioning
confidence: 99%
“…synthesis, translate, place & route, and then a bit-stream generation. Various fault injection tools have been devised in the past several years for FPGA-based designs, which work on different stages of the development flow [3], [4] as shown in Fig. 1.…”
Section: Introductionmentioning
confidence: 99%
“…We selected a set-point value for each design and each fault model. The experimental way to obtain the sp-value is described in [21]. The procedure for / / O r i g i n a l d e s i g n module c17 ( N1 , N2 , N3 , N6 , N7 , N22 , N23 ) ; i n p u t N1 , N2 , N3 , N6 , N7 ; o u t p u t N22 , N23 ; w i r e N10 , N11 , N16 , N19 ;…”
Section: B Hardness Analysis: Identification Of Sensitive Nodesmentioning
confidence: 99%