2015
DOI: 10.1016/j.sse.2014.12.012
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Variability of bandgap and carrier mobility caused by edge defects in ultra-narrow graphene nanoribbons

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Cited by 15 publications
(7 citation statements)
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“…The field-effect carrier mobility is calculated using the following equation , where t oxide is the thickness of SiO 2 , ϵ is the relative dielectric constant of SiO 2 , L and W are the channel length and width, respectively. The mobility of the GNR-FET was calculated as 840 cm 2 /V s. This is also, to the best of our knowledge, the highest mobility reported in semiconducting GNRs so far and close to the theoretical scattering limit of ∼1000 cm 2 /V s in sub-3 nm wide GNRs at room temperature . This result indicates that the obtained GNRs are of high quality and close to pristine, which is in line with the spectroscopic analysis.…”
Section: Resultssupporting
confidence: 86%
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“…The field-effect carrier mobility is calculated using the following equation , where t oxide is the thickness of SiO 2 , ϵ is the relative dielectric constant of SiO 2 , L and W are the channel length and width, respectively. The mobility of the GNR-FET was calculated as 840 cm 2 /V s. This is also, to the best of our knowledge, the highest mobility reported in semiconducting GNRs so far and close to the theoretical scattering limit of ∼1000 cm 2 /V s in sub-3 nm wide GNRs at room temperature . This result indicates that the obtained GNRs are of high quality and close to pristine, which is in line with the spectroscopic analysis.…”
Section: Resultssupporting
confidence: 86%
“…The mobility of the GNR-FET was calculated as 840 cm 2 /V s. This is also, to the best of our knowledge, the highest mobility reported in semiconducting GNRs so far and close to the theoretical scattering limit of ∼1000 cm 2 /V s in sub-3 nm wide GNRs at room temperature. 23 This result indicates that the obtained GNRs are of high quality and close to pristine, which is in line with the spectroscopic analysis.…”
Section: ■ Results and Discussionsupporting
confidence: 85%
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“…Thus, modeling edge roughness is very useful to examine the effect of process variation on circuit performance of GNR FET. The dispersion of the electrical characteristics due to random edge defects in realistic nanoribbons can be precisely evaluated by statistical analysis at the device-level, based on the atomistic quantum transport simulations of large ensembles of randomly-generated GNRs [9]. Figure 1 shows the 3D view of a GNR FET, where the ribbon of the armchair chirality GNR is the channel material in a MOSFET-like structure.…”
Section: Introductionmentioning
confidence: 99%