Variable Launch System for the Metrology of EOCBs

Abstract

Optical links within data centres are critical components supporting increasing data consumption. These links vary in technologies, and metrological standards for the industry are still being developed. Concerning specific multimode interconnects for high data rates, we present the use of a system incorporating a variable controlled launch condition as a platform for characterizing the effect of temperature on electro-optical circuit boards (EOCBs) for metrology. We examine the performance impact on key parameters such as bit error ratio (BER). We conclude with a vision on the future of data centre networks and the requirement for standard bodies to introduce new industry-agreed metrology techniques for standardization.