“…In reality, the significant uncertainties on the geometry and material properties are unavoidable due to lowprecision manufacturing processes of MEMS devices [1,2,3,4,5]. In the past, Monte Carlo method based on FEM (finite element method) was used to consider the uncertainty associated with the various input parameters during the design of electrostatic MEMS devices [6,7,8]. Recently, several improved approaches based on MC simulation, such as lumped parameter model [9,10], Reduced order model [11,12], Sparse-grid stochastic collocation method [13] and Latin hypercube sampling [14], have been proposed for the reliability-based optimal design.…”