Vector Network Analyzer Ferromagnetic Resonance Study of Py Thin Films

Shin, Yong-Hwack; Ha, S. Y.; Kim, Duck-Ho; You, Chun‐Yeol

doi:10.4283/jkms.2010.20.1.018

Journal of the Korean Magnetics Society

2010

DOI: 10.4283/jkms.2010.20.1.018

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Vector Network Analyzer Ferromagnetic Resonance Study of Py Thin Films

Yong-Hwack Shin¹,

S. Y. Ha²,

Duck-Ho Kim³

et al.

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2011

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Optimization of Ferromagnetic Resonance Spectra Measuring Procedure for Accurate Gilbert Damping Parameter in Magnetic Thin Films Using a Vector Network Analyzer

Kim¹,

Kim²,

You³

et al. 2011

Journal of Magnetics

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We optimize a vector network analyzer ferromagnetic resonance (VNA-FMR) measurement system to study spin dynamics and Gilbert damping parameters of thin ferromagnetic films. In order to obtain accurate damping parameters, careful determination of the susceptibility line-width is required. The measured S-parameters are converted into the corresponding susceptibility through a calibration processes. From the line-width measurements, we can successfully extract the saturation magnetizations and Gilbert damping parameters of 5-, 8-, and 10-nm thick Ni 81 Fe 19 (Py) films.

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Optimization of Ferromagnetic Resonance Spectra Measuring Procedure for Accurate Gilbert Damping Parameter in Magnetic Thin Films Using a Vector Network Analyzer

Kim¹,

Kim²,

You³

et al. 2011

Journal of Magnetics

Self Cite

View full text Add to dashboard Cite

show abstract

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Vector Network Analyzer Ferromagnetic Resonance Study of Py Thin Films

Cited by 1 publication

References 8 publications

Optimization of Ferromagnetic Resonance Spectra Measuring Procedure for Accurate Gilbert Damping Parameter in Magnetic Thin Films Using a Vector Network Analyzer

Optimization of Ferromagnetic Resonance Spectra Measuring Procedure for Accurate Gilbert Damping Parameter in Magnetic Thin Films Using a Vector Network Analyzer

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